IP Library › Assignment 030770/0249
Patent Assignment
Reel/Frame 030770/0249

Assignment of Assignor's Interest

Recorded: 2013-07-10 Pages: 2
Assignors
SHIBAHARA, TAKUMA
Executed: 2013-06-17
OIKAWA, MICHIO
Executed: 2013-06-17
SAKAI, KEI
Executed: 2013-06-10
YAMAGUCHI, SATORU
Executed: 2013-06-10
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME,, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Semiconductor Circuit Pattern Measuring Apparatus and Method
Patent: 9,336,587 →
Application: 13/868,352 →
Publication: US 2014/0003703
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →