Patent Assignment
Reel/Frame 031077/0946
Assignment of Assignor's Interest
Recorded: 2013-08-26
Pages: 4
Assignors
YANASE, YOSHIHATA
Executed: 2013-08-01
SHIRAI, HIROSHI
Executed: 2013-08-02
KOMIYAMA, JUN
Executed: 2013-08-02
OISHI, HIROSHI
Executed: 2013-08-02
Assignee
COVALENT MATERIALS CORPORATION
6-3, OHSAKI 1-CHOME, SHINAGAWA-KU, TOKYO, JAPAN
Covered Property
(1)
Method of Analyzing Nitride Semiconductor Layer and Method of Manufacturing Nitride Semiconductor Substrate Using the Analysis Method
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.