Patent Assignment
Reel/Frame 031323/0749
Assignment of Assignor's Interest
Recorded: 2013-10-01
Pages: 6
Assignors
WANG, DAVID Y.
Executed: 2013-09-23
FLOCK, KLAUS
Executed: 2013-09-20
ROTTER, LAWRENCE
Executed: 2013-09-20
KRISHNAN, SHANKAR
Executed: 2013-09-30
DE VEER, JOHANNES D.
Executed: 2013-09-23
FILIP, CATALIN
Executed: 2013-09-21
BRADY, GREGORY
Executed: 2013-09-23
ARAIN, MUZAMMIL
Executed: 2013-09-23
SHCHEGROV, ANDREI
Executed: 2013-09-23
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Properties
(3)
Multiple Angles of Incidence Semiconductor Metrology Systems and Methods
Multiple Angle of Incidence Semiconductor Metrology System
Application:
61/752,202 →
Multiple Angles of Incidence Semiconductor Metrology System and Methods
Application:
61/878,561 →