IP Library › Assignment 031693/0605
Patent Assignment
Reel/Frame 031693/0605

Assignment of Assignor's Interest

Recorded: 2013-11-21 Pages: 3
Assignors
WU, LIWEI
Executed: 2013-11-01
DONG, JUNQING
Executed: 2013-11-01
Assignee
SHANGHAI MICRO ELECTRONICS EQUIPMENT CO., LTD.
1525 ZHANGDONG ROAD, PUDONG NEW AREA, SHANGHAI, 201203, CHINA
Covered Property (1)
Method for Measuring and Calibrating Centroid of Coarse Stage of Photolithography Tool
Patent: 9,519,231 →
Application: 14/115,284 →
Publication: US 2014/0074428
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 30, 2017
From: SHANGHAI MICRO ELECTRONICS EQUIPMENT CO., LTD.
To: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
Reel/Frame 043517/0989 →
Corrective Assignment to Correct the Application Serial Number Previously Recorded at Reel: 043517 Frame: 0989. Assignor(S) Hereby Confirms the Assignment. Mar 29, 2019
From: SHANGHAI MICRO ELECTRONICS EQUPIMENT CO., LTD.
To: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
Reel/Frame 048745/0860 →