IP Library › Assignment 032196/0346
Patent Assignment
Reel/Frame 032196/0346

Assignment of Assignor's Interest

Recorded: 2014-02-11 Pages: 2
Assignors
HARADA, MINORU
Executed: 2014-01-15
MIYAMOTO, ATSUSHI
Executed: 2014-01-15
HIRAI, TAKEHIRO
Executed: 2014-01-20
FUKUNAGA, FUMIHIKO
Executed: 2014-01-20
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Defect Inspection Device
Patent: 9,165,356 →
Application: 14/238,105 →
Publication: US 2014/0169657
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →