IP Library › Assignment 032487/0085
Patent Assignment
Reel/Frame 032487/0085

Assignment of Assignor's Interest

Recorded: 2014-03-20 Pages: 4
Assignors
KOZAKAI, TOMOKAZU
Executed: 2014-03-17
ARAMAKI, FUMIO
Executed: 2014-03-17
MATSUDA, OSAMU
Executed: 2014-03-17
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Charged Particle Beam Apparatus and Method for Forming Observation Image
Patent: 8,890,093 →
Application: 14/217,990 →
Publication: US 2014/0291509
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →