IP Library › Assignment 032498/0085
Patent Assignment
Reel/Frame 032498/0085

Assignment of Assignor's Interest

Recorded: 2014-03-21 Pages: 4
Assignors
ASAHATA, TATSUYA
Executed: 2014-03-19
TORIKAWA, SHOTA
Executed: 2014-03-19
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Focused Ion Beam System, Sample Processing Method Using the Same, and Sample Processing Program Using Focused Ion Beam
Patent: 9,218,939 →
Application: 14/221,548 →
Publication: US 2014/0284307
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →