IP Library › Assignment 032788/0488
Patent Assignment
Reel/Frame 032788/0488

Assignment of Assignor's Interest

Recorded: 2014-04-30 Pages: 2
Assignors
TANIGUCHI, ATSUSHI
Executed: 2014-01-08
UENO, TAKETO
Executed: 2014-01-09
MATSUMOTO, SHUNICHI
Executed: 2014-01-16
SHIBATA, YUKIHIRO
Executed: 2014-01-09
HONDA, TOSHIFUMI
Executed: 2014-01-09
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspecting Apparatus and Defect Inspecting Method
Patent: 8,970,836 →
Application: 14/235,916 →
Publication: US 2014/0233024
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →