IP Library › Assignment 032969/0352
Patent Assignment
Reel/Frame 032969/0352

Assignment of Assignor's Interest

Recorded: 2014-05-27 Pages: 2
Assignors
MATSUMOTO, SHUNICHI
Executed: 2013-12-26
TANIGUCHI, ATSUSHI
Executed: 2014-01-07
HONDA, TOSHIFUMI
Executed: 2014-01-09
SHIBATA, YUKIHIRO
Executed: 2013-12-26
URANO, YUTA
Executed: 2014-01-06
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Method and Defect Inspection Device
Patent: 9,291,574 →
Application: 14/232,929 →
Publication: US 2014/0268122
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →