Patent Assignment
Reel/Frame 033042/0571
Assignment of Assignor's Interest
Recorded: 2014-06-05
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Scanning Ion Microscope and Secondary Particle Control Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.