Patent Assignment
Reel/Frame 033393/0034
Assignment of Assignor's Interest
Recorded: 2014-07-25
Pages: 5
Assignors
YANG, KIHO
Executed: 2014-06-27
YANG, SEUNGHUNE
Executed: 2014-06-27
CAI, SIBO
Executed: 2014-06-27
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129 SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 443-742, KOREA, REPUBLIC OF
Covered Property
(1)
Methods of Inspecting a Semiconductor Device and Semiconductor Inspection Systems