IP Library Assignment 034570/0957
Patent Assignment
Reel/Frame 034570/0957

Assignment of Assignor's Interest

Recorded: 2014-12-22 Pages: 4
Assignors
TANAKA, KEIICHI
Executed: 2014-12-17
ODAWARA, AKIKAZU
Executed: 2014-12-17
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
X-Ray Fluorescence Analysis Apparatus
Patent: 9,645,100 →
Application: 14/579,630 →
Publication: US 2015/0177167
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →