Assignment of Assignor's Interest

Recorded: 2014-12-23 Pages: 6

Assignors

DURBIN, AARON

Executed: 2011-09-27

KEITH, DAVID

Executed: 2011-09-27

JOHNSON, MORGAN T.

Executed: 2011-09-27

Assignee

ADVANCED INQUIRY SYSTEMS, INC.

7685 SW CIRRUS DRIVE, TIGARD, OREGON, 97008

Covered Properties (2)

Wafer Testing System and Associated Methods of Use and Manufacture

Patent: 8,872,533 →

Application: 13/849,887 →

Publication: US 2013/0314115

Wafer Testing System and Associated Methods of Use and Manufacture

Patent: 9,612,259 →

Application: 14/498,905 →

Publication: US 2015/0015292

Related Assignments (1)

Other recorded transfers of the patents in this record — the chain of ownership.