Wafer testing system and associated methods of use and manufacture
View Patent ↗A wafer testing system and associated methods of use an manufacture are disclosed herein. In one embodiment, the wafer testing system includes an assembly for releaseably attaching a wafer to a wafer translator and the wafer translator to an interposer by means of separately operable vacuums, or pressure differentials. The assembly includes a wafer translator support ring coupled to the wafer translator, wherein a first flexible material extends from the wafer translator support ring so as to enclose the space between the wafer translator and the interposer so that the space may be evacuated by a first vacuum through one or more first evacuation paths. The assembly can further include a wafer support ring coupled to the wafer and the chuck, wherein a second flexible material extends from wafer support ring so as to enclose the space between the wafer and the wafer translator so that the space may be evacuated by a second vacuum through one or more second evacuation pathways.
1. A wafer testing system, comprising:
an interposer having a first surface and a second surface facing away from the first surface, wherein at least one contact pad at the first surface is electrically connected with at least one contact pad at the second surface;
a wafer translator having:
a substrate having a first side facing the interposer and a second side facing away from the first side, the second side positioned to face toward a wafer,
a first terminal at the first side,
a second terminal at the second side, positioned to contact a corresponding wafer terminal, wherein the first terminal is larger than the second terminal, and
an electrical pathway connecting the first and second terminals; and
a translator support configured to receive the wafer translator, the translator support having a seal configured to seal a space between the wafer translator and the interposer.
2. The wafer testing system of claim 1 wherein the translator support includes a pathway configured to fluidly connect the space between the wafer translator and the interposer with a first vacuum.
3. The wafer testing system of claim 1 wherein:
the translator support includes a ring having a groove configured to receive the seal; and
the seal includes a generally flexible material at least partially received in the groove of the ring.
4. The wafer testing system of claim 1 wherein:
the translator support includes a ring having a groove; and
the seal includes a base portion and an upper portion extending from the base portion, the base portion being received in the groove of the ring.
5. The wafer testing system of claim 1 wherein:
the translator support includes a ring having a groove with a flange;
the seal includes a base portion and an upper portion extending from the base portion; and
the base portion is received in the groove of the ring and retained by the flange of the groove.
6. The wafer testing system of claim 1 wherein:
the translator support includes a ring having a groove with a flange;
the seal includes a base portion and an upper portion extending from the base portion;
the base portion is received in the groove of the ring and retained by the flange of the groove; and
the upper portion is angled circumferentially outward with respect to the translator support.
7. The wafer testing system of claim 1 wherein the seal is a first seal, the wafer testing system further comprising:
a second seal configured to seal a space between the wafer and the wafer translator.
8. The wafer testing system of claim 1 , further comprising:
a device interface board having a first surface and a second surface facing away from the first surface, the second surface of the device interface board facing the interposer, wherein the device interface board has electrical interconnections between the first and second surfaces.
9. The wafer testing system of claim 7 wherein the first seal seals the space between the wafer translator and the interposer under a first vacuum, and the second seal seals the space between the wafer translator and the wafer under a second vacuum.
10. The wafer testing system of claim 9 wherein the first and second vacuums are individually operable.
11. The wafer testing system of claim 9 , further comprising a source of a third vacuum in a fluid communication with the space between the wafer and a prober, wherein the first, second and third vacuums are individually operable.