IP Library › Assignment 034772/0039
Patent Assignment
Reel/Frame 034772/0039

Assignment of Assignor's Interest

Recorded: 2015-01-21 Pages: 3
Assignor
MAN, XIN
Executed: 2015-01-19
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Charged Particle Beam Apparatus and Sample Observation Method
Patent: 9,384,941 →
Application: 14/601,478 →
Publication: US 2015/0206706
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0636 →
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0223 →