Patent Assignment
Reel/Frame 035730/0421
Assignment of Assignor's Interest
Recorded: 2015-05-28
Pages: 2
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
NO. 8, LI-HSIN RD. VI, HSINCHU SCIENCE PARK, HSINCHU, 300, TAIWAN
Covered Property
(1)
System and Method of Filtering Actual Defects from Defect Information for a Wafer