Patent Assignment
Reel/Frame 035935/0097
Assignment of Assignor's Interest
Recorded: 2015-06-30
Pages: 4
Assignor
FUJITSU SEMICONDUCTOR LIMITED
Executed: 2015-03-02
Assignee
SOCIONEXT INC.
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU, YOKOHAMA-SHI, KANAGAWA, 222-0033, JAPAN
Covered Properties
(5)
Semiconductor Testing Circuit, Semiconductor Testing Jig, Semiconductor Testing Apparatus, and Semiconductor Testing Method
Successive Approximation a/D Converter
Memory Controller and Memory Controlling Method
Comparator and Correction Method Therefor
Data Signal Correction Circuit, Receiver, and Data Signal Correction Method
Related Assignments
(6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 21, 2010
From: WATANABE, YUICHI; SHINADA, KIYOTAKA; KIMURA, YUUSHIN; GOTO, SHIGERU
To: FUJITSU LIMITED; FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 025021/0449 →
Assignment of Assignor's Interest
Jul 20, 2011
From: ARUGA, KENTA; TACHIBANA, SUGURU; TSUKAMOTO, SANROKU; OKADA, KOJI
To: FUJITSU LIMITED; FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 026622/0867 →
Assignment of Assignor's Interest
Sep 26, 2011
From: HATANO, HIROSHI; NISHIKAWA, TAKASHI; TOICHI, MASAHIKO
To: FUJITSU LIMITED; FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 027099/0282 →
Assignment of Assignor's Interest
Nov 1, 2013
From: HOSHINO, MASANORI; DANJO, TAKUMI
To: FUJITSU LIMITED; FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 031530/0371 →
Assignment of Assignor's Interest
Feb 18, 2014
From: TAKAGI, HIROAKI; UMEDA, MASATAKA; ADACHI, NAOTO
To: FUJITSU SEMICONDUCTOR LIMITED; FUJITSU LIMITED
Reel/Frame 032238/0139 →
Assignment of Assignor's Interest
Apr 17, 2018
From: FUJITSU LIMITED
To: SOCIONEXT INC.
Reel/Frame 045562/0324 →