IP Library › Assignment 036058/0748
Patent Assignment
Reel/Frame 036058/0748

Assignment of Assignor's Interest

Recorded: 2015-07-10 Pages: 3
Assignors
SUZUKI, MAKOTO
Executed: 2015-06-23
YAMAGUCHI, SATORU
Executed: 2015-06-23
SAKAI, KEI
Executed: 2015-06-23
ISAWA, MIKI
Executed: 2015-06-23
TAKADA, SATOSHI
Executed: 2015-06-23
HASUMI, KAZUHISA
Executed: 2015-06-23
IKOTA, MASAMI
Executed: 2015-06-23
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method for Pattern Measurement, Method for Setting Device Parameters of Charged Particle Radiation Device, and Charged Particle Radiation Device
Patent: 9,831,062 →
Application: 14/760,322 →
Publication: US 2015/0357158
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →