Assignment of Assignor's Interest

Recorded: 2016-02-08 Pages: 3

Assignors

NEBUYA, SATORU

Executed: 2016-01-22

HIFUMI, SO

Executed: 2016-01-23

Assignee

9-1, SHIROKANE 5-CHOME, MINATO-KU, TOKYO, 108-8641, JAPAN

Covered Property (1)

Eit Measurement Device, Eit Measurement Method and Program

Patent: 10,285,618 →

Application: 14/901,445 →

Publication: US 2016/0302690