EIT measurement device, EIT measurement method and program

1. An electrical impedance tomography (EIT) measurement device comprising:

a measurement belt to which a plurality of electrode pads arranged in a row and a plurality of strain gauges arranged in parallel to the plurality of electrode pads are integrally adhered and configured to be used after being wrapped around a portion serving as a measurement target of a living body; and

a processor configured to:

acquire a tomographic image of the portion serving as the measurement target while applying a current to the plurality of electrode pads and acquiring a voltage signal generated between the electrode pads; and

estimate a contour shape of the portion serving as the measurement target and a size of the contour shape on the basis of curvature data acquired via the plurality of strain gauges,

wherein the processor is further configured to:

set coordinate positions of a plurality of reference points as predetermined initial coordinate values, each of the coordinate positions of the plurality of reference points indicating a position of one strain gauge among the plurality of strain gauges arranged in the row;

calculate relative coordinate values indicating coordinate positions of subordinate points according to the curvature data, the coordinate positions of the subordinate points indicating positions of one or more strain gauges with respect to the coordinate positions of adjacent reference points of the plurality of reference points, and the one or more strain gauges being disposed between the strain gauges indicated by the adjacent reference points of the plurality of reference points,

change coordinate positions of a first reference point and a second reference point different from the first reference point among the plurality of reference points such that coordinate positions between a first subordinate point and a second subordinate point becomes closest, the first subordinate point being the subordinate point whose coordinate position is determined from the relative coordinate value with respect to the coordinate position of the first reference point, the second subordinate point being the subordinate point whose coordinate position is determined from the relative coordinate value with respect to the coordinate position of the second reference point, and the first and second subordinate points indicating the position of the same strain gauge,

determine the coordinate positions of two subordinate points indicating positions of strain gauges disposed adjacently at both sides of each strain gauge indicated by each reference point as the coordinate position of a center point between the first subordinate point and the second subordinate point after the coordinate positions of the first reference point and the second reference point are changed; and,

estimate a contour shape and a size of the contour shape based on the relative positional relation of the positions of the reference and subordinate points using a predetermined function curve.

2. The EIT measurement device according to claim 1 , wherein the processor is configured to enlarge or reduce the specified contour shape so that a perimeter of the estimated contour shape matches a separately measured perimeter of the portion serving as the measurement target after the contour shape is determined.

3. The EIT measurement device according to claim 1 , wherein the processor is configured to determine the coordinate position of the reference point indicating the strain gauge arranged on a symmetric axis of the portion serving as the measurement target among the plurality of strain gauges as predetermined initial coordinate values when the coordinate positions of the plurality of reference points as predetermined initial coordinate values are set.

4. The EIT measurement device according to claim 3 , wherein the processor is configured to regard the strain gauge as being arranged on the symmetric axis of the portion serving as the measurement target to determine a relative positional relation for the plurality of strain gauges, when no strain gauge is arranged at a position arranged on the true symmetric axis of the portion serving as the measurement target on the measurement belt wrapped around the portion serving as the measurement target.

5. The EIT measurement device according to claim 1 ,

wherein the processor is configured to set a plurality of supplementary points for determining a curve connecting a position of one strain gauge and a position of another strain gauge adjacent to the one strain gauge when the contour shape is determined, and

wherein a distance from an origin of the plurality of supplementary points is determined by a predetermined function at an angle formed by the supplementary points, the origin, and the position of the one strain gauge.

6. The EIT measurement device according to claim 1 , comprising:

a perimeter measurement electrode pad arranged in parallel to the plurality of electrode pads and adhered to the measurement belt; and

a perimeter measurement unit configured to measure a perimeter of the portion serving as the measurement target on the basis of a voltage signal acquired via the perimeter measurement electrode pad.

7. An EIT measurement method comprising:

winding a measurement belt to which a plurality of electrode pads arranged in a row and a plurality of strain gauges arranged in parallel to the plurality of electrode pads are integrally adhered around a portion serving as a measurement target of a living body;

acquiring a tomographic image of the portion serving as the measurement target while applying a current to the plurality of electrode pads and acquiring a voltage signal generated between the electrode pads;

determining a relative positional relation for every strain gauge;

estimating a contour shape of the portion serving as the measurement target and a size of the contour shape on the basis of curvature data acquired via the plurality of strain gauges;

wherein the specifying method further comprises:

setting specifying coordinate positions of a plurality of reference points as predetermined initial coordinate values, each of the coordinate positions of the plurality of reference points indicating a position of one strain gauge among the plurality of strain gauges arranged in the row;

calculating relative coordinate values indicating coordinate positions of subordinate points according to the curvature data, the coordinate positions of the subordinate points indicating positions of one or more strain gauges with respect to the coordinate positions of adjacent reference points of the plurality of reference points, and the one or more strain gauges being disposed between the strain gauges indicated by the adjacent reference points of the plurality of reference points,

changing coordinate positions of a first reference point and a second reference point different from the first reference point among the plurality of reference points such that coordinate positions between a first subordinate point and a second subordinate point becomes closest, the first subordinate point being the subordinate point whose coordinate position is determined from the relative coordinate value with respect to the coordinate position of the first reference point, the second subordinate point being the subordinate point whose coordinate position is determined from the relative coordinate value with respect to the coordinate position of the second reference point, and the first and second subordinate points indicating the position of the same strain gauge;

specifying the coordinate positions of two subordinate points indicating positions of strain gauges disposed adjacently at both sides of each strain gauge indicated by each reference point as the coordinate position of a center point between the first subordinate point and the second subordinate point after the coordinate positions of the first reference point and the second reference point are changed; and,

estimating a contour shape and a size of the contour shape based on the relative positional relation of the positions of the reference and subordinate points using a predetermined function curve.

8. A non-transitory storage medium storing a program for causing a computer of an EIT measurement device, which includes a measurement belt to which a plurality of electrode pads arranged in a row and a plurality of strain gauges arranged in parallel to the plurality of electrode pads are integrally adhered and configured to be used after being wrapped around a portion serving as a measurement target of a living body to:

acquire a tomographic image of the portion serving as the measurement target while applying a current to the plurality of electrode pads and acquiring a voltage signal generated between the electrode pads; and

estimate a contour shape of the portion serving as the measurement target and a size of the contour shape on the basis of curvature data acquired via the plurality of strain gauges,

wherein the program further causes the processor to:

set coordinate positions of a plurality of reference points as predetermined initial coordinate values, each of the coordinate positions of the plurality of reference points indicating a position of one strain gauge among the plurality of strain gauges arranged in the row;

calculate relative coordinate values indicating coordinate positions of subordinate points according to the curvature data, the coordinate positions of the subordinate points indicating positions of one or more strain gauges with respect to the coordinate positions of adjacent reference points of the plurality of reference points, and the one or more strain gauges being disposed between the strain gauges indicated by the adjacent reference points of the plurality of reference points;

change coordinate positions of a first reference point and a second reference point different from the first reference point among the plurality of reference points such that coordinate positions between a first subordinate point and a second subordinate point becomes closest, the first subordinate point being the subordinate point whose coordinate position is determined from the relative coordinate value with respect to the coordinate position of the first reference point, the second subordinate point being the subordinate point whose coordinate position is determined from the relative coordinate value with respect to the coordinate position of the second reference point, and the first and second subordinate points indicating the position of the same strain gauge;

determine the coordinate positions of two subordinate points indicating positions of strain gauges disposed adjacently at both sides of each strain gauge indicated by each reference point as the coordinate position of a center point between the first subordinate point and the second subordinate point after the coordinate positions of the first reference point and the second reference point are changed; and,

estimate a contour shape and a size of the contour shape based on the relative positional relation of the positions of the reference points and subordinate points using a predetermined function curve.

9. An EIT measurement device comprising:

a measurement belt to which a plurality of electrode pads arranged in a row and a plurality of curvature sensors arranged in parallel to the plurality of electrode pads are integrally adhered and configured to be used after being wrapped around a portion serving as a measurement target of a living body; and

a processor configured to:

acquire a tomographic image of the portion serving as the measurement target while applying a current to the plurality of electrode pads and acquiring a voltage signal generated between the electrode pads; and

estimate a contour shape of the portion serving as the measurement target and a size of the contour shape on the basis of curvature data acquired via the curvature sensor,

wherein the processor is further configured to: specify

set coordinate positions of a plurality of reference points as predetermined initial coordinate values, each of the coordinate positions of the plurality of reference points indicating a position of one curvature sensor among the plurality of curvature sensors arranged in the row,

calculate relative coordinate values indicating coordinate positions of subordinate points according to the curvature data, the coordinate positions of adjacent reference points of the subordinate points indicating positions of one or more curvature sensors with respect to the coordinate positions of the plurality of reference points, and the one or more curvature sensors being disposed between the curvature sensors indicated by the adjacent reference points the plurality of reference points,

change coordinate positions of a first reference point and a second reference point different from the first reference point among the plurality of reference points such that coordinate positions between a first subordinate point and a second subordinate point becomes closest, the first subordinate point being the subordinate point whose coordinate position is determined from the relative coordinate value with respect to the coordinate position of the first reference point, the second subordinate point being the subordinate point whose coordinate position is determined from the relative coordinate value with respect to the coordinate position of the second reference point, and the first and second subordinate points indicating the position of the same curvature sensor

determine the coordinate positions of two subordinate points indicating positions of curvature sensors disposed adjacently at both sides of each curvature sensor indicated by each reference point as the coordinate position of a center point between the first subordinate point and the second subordinate point after the coordinate positions of the first reference point and the second reference point are changed; and,

estimate a contour shape and a size of a contour shape based on the relative positional relation of the positions of the reference points and subordinate points using a predetermined function curve.