IP Library Assignment 038851/0511
Patent Assignment
Reel/Frame 038851/0511

Assignment of Assignor's Interest

Recorded: 2016-05-18 Pages: 2
Assignor
DAWSON, CHAD
Executed: 2016-05-17
Assignee
FREESCALE SEMICONDUCTOR, INC.
6501 WILLIAM CANNON DRIVE WEST, AUSTIN, TEXAS, US 78735
Covered Property (1)
Stress isolated detector element and microbolometer detector incorporating same
Patent: 9,528,881 →
Application: 14/999,523 →
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 9, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040579/0827 →
Change of Name Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
Corrective Assignment to Correct the Assignment Documentation - Initial Convenyance Listed Change of Name. Previously Recorded on Reel 040579 Frame 0827. Assignor(S) Hereby Confirms the Update Conveyance to Merger and Change of Name Effective November 7, 2016. Dec 15, 2016
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 040945/0252 →
Corrective Assignment to Correct the Nature of Conveyance Previously Recorded at Reel: 040626 Frame: 0683. Assignor(S) Hereby Confirms the Merger and Change of Name Effective November 7, 2016. Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →