Patent Assignment
Reel/Frame 038926/0531
Assignment of Assignor's Interest
Recorded: 2016-06-16
Pages: 5
Assignors
LEEM, CHOON-SHIK
Executed: 2016-05-03
JUNG, WOO-JIN
Executed: 2016-05-04
JUN, CHUNG-SAM
Executed: 2016-05-04
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129 SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Apparatus for Inspecting Wafer