Patent Assignment
Reel/Frame 039021/0498
Assignment of Assignor's Interest
Recorded: 2016-06-27
Pages: 5
Assignee
FEMTOMETRIX, INC.
1850 EAST ST. ANDREW PLACE, SANTA ANA, CALIFORNIA, 92705
Covered Properties
(5)
Wafer Metrology Technologies
PCT:
PCT/US2015/026263 ↗
Pump and Probe Type Second Harmonic Generation Metrology
Application:
14/690,179 →
Publication:
US 2015/0330908
Field-Biased Second Harmonic Generation Metrology
Application:
14/690,251 →
Publication:
US 2015/0331036
Charge Decay Measurement Systems and Methods
Application:
14/690,256 →
Publication:
US 2015/0331029
Wafer Metrology Techonologies
Application:
14/690,279 →
Publication:
US 2015/0330909
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 28, 2016
From: KOLDIAEV, VIKTOR; KRYGER, MARC; CHANGALA, JOHN
To: FEMTOMETRIX, INC.
Reel/Frame 039028/0867 →
Certificate of Conversion from a Non-Delaware Corporation to a Delaware Corporation
Jun 28, 2016
From: FEMTOMETRIX, INC.
To: FEMTOMETRIX, INC.
Reel/Frame 039194/0850 →