Assignment of Assignor's Interest

Recorded: 2016-06-28 Pages: 6

Assignors

KOLDIAEV, VIKTOR

Executed: 2014-03-04

KRYGER, MARC

Executed: 2014-03-04

CHANGALA, JOHN

Executed: 2014-03-04

Assignee

FEMTOMETRIX, INC.

1850 EAST ST. ANDREW PLACE, SANTA ANA, CALIFORNIA, 92705

Covered Properties (5)

Wafer Metrology Technologies

PCT: PCT/US2015/026263 ↗

Pump and Probe Type Second Harmonic Generation Metrology

Application: 14/690,179 →

Publication: US 2015/0330908

Field-Biased Second Harmonic Generation Metrology

Application: 14/690,251 →

Publication: US 2015/0331036

Charge Decay Measurement Systems and Methods

Application: 14/690,256 →

Publication: US 2015/0331029

Wafer Metrology Techonologies

Application: 14/690,279 →

Publication: US 2015/0330909

Related Assignments (2)

Other recorded transfers of the patents in this record — the chain of ownership.