Patent Assignment
Reel/Frame 039194/0850
Certificate of Conversion from a Non-Delaware Corporation to a Delaware Corporation
Recorded: 2016-06-28
Pages: 5
Assignor
FEMTOMETRIX, INC.
Executed: 2014-08-26
Assignee
FEMTOMETRIX, INC.
1850 EAST ST. ANDREW PLACE, SANTA ANA, CALIFORNIA, 92705
Covered Properties
(5)
Wafer Metrology Technologies
PCT:
PCT/US2015/026263 ↗
Pump and Probe Type Second Harmonic Generation Metrology
Application:
14/690,179 →
Publication:
US 2015/0330908
Field-Biased Second Harmonic Generation Metrology
Application:
14/690,251 →
Publication:
US 2015/0331036
Charge Decay Measurement Systems and Methods
Application:
14/690,256 →
Publication:
US 2015/0331029
Wafer Metrology Techonologies
Application:
14/690,279 →
Publication:
US 2015/0330909
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.