Patent Assignment
Reel/Frame 039618/0688
Assignment of Assignor's Interest
Recorded: 2016-09-01
Pages: 7
Assignors
HAO, ZHIYONG
Executed: 2015-11-03
ZHAO, YULIANG
Executed: 2015-11-03
ZHU, YONGFENG
Executed: 2015-11-03
Assignee
FREESCALE SEMICONDUCTOR,INC.
6501 WILLIAM CANNON DRIVE WEST TX30/OE62, AUSTIN, TEXAS, 78735
Covered Property
(1)
Testing Multi-Core Integrated Circuit with Parallel Scan Test Data Inputs and Outputs
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
Corrective Assignment to Correct the Nature of Conveyance Previously Recorded at Reel: 040626 Frame: 0683. Assignor(S) Hereby Confirms the Merger and Change of Name Effective November 7, 2016.
Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →