IP Library › Assignment 039779/0962
Patent Assignment
Reel/Frame 039779/0962

Assignment of Assignor's Interest

Recorded: 2016-09-19 Pages: 2
Assignors
SHISHIDO, CHIE
Executed: 2016-04-27
YAMAMOTO, TAKUMA
Executed: 2016-05-16
TANAKA, MAKI
Executed: 2016-05-09
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Scanning Electron Microscope System, Pattern Measurement Method Using Same, and Scanning Electron Microscope
Patent: 9,852,881 →
Application: 15/039,527 →
Publication: US 2016/0379798
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Corrective Assignment to Add the Omitted Third Inventor's Data Previously Recorded on Reel 039779 Frame 0962. Assignor(S) Hereby Confirms the Assignment. Sep 26, 2016
From: SHISHIDO, CHIE; YAMAMOTO, TAKUMA; YAMADA, SHINYA; TANAKA, MAKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 040145/0835 →
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →