Corrective Assignment to Add the Omitted Third Inventor's Data Previously Recorded on Reel 039779 Frame 0962. Assignor(S) Hereby Confirms the Assignment.

Recorded: 2016-09-26 Pages: 6

Assignors

SHISHIDO, CHIE

Executed: 2016-04-27

YAMAMOTO, TAKUMA

Executed: 2016-05-16

YAMADA, SHINYA

Executed: 2016-09-06

TANAKA, MAKI

Executed: 2016-05-09

Assignee

24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN

Covered Property (1)

Scanning Electron Microscope System, Pattern Measurement Method Using Same, and Scanning Electron Microscope

Patent: 9,852,881 →

Application: 15/039,527 →

Publication: US 2016/0379798

Related Assignments (2)

Other recorded transfers of the patent in this record — the chain of ownership.