IP Library Assignment 040314/0071
Patent Assignment
Reel/Frame 040314/0071

Assignment of Assignor's Interest

Recorded: 2016-11-14 Pages: 3
Assignors
PAN, WEIWEI
Executed: 2014-09-05
ZHENG, YONGJUN
Executed: 2014-09-05
Assignee
SEMITRONIX CORPORATION
99 HUAXING ROAD, SUITE B412, HANGZHOU, 310012, CHINA
Covered Property (1)
Addressable test circuit and test method for key parameters of transistors
Patent: 9,817,058 →
Application: 15/351,421 →
Publication: US 2017/0059645
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 17, 2021
From: SEMITRONIX CORPORATION
To: SEMITRONIX CORPORATION; ZHEJIANG UNIVERSITY
Reel/Frame 055951/0051 →