IP Library Assignment 055951/0051
Patent Assignment
Reel/Frame 055951/0051

Assignment of Assignor's Interest

Recorded: 2021-04-17 Pages: 4
Assignor
SEMITRONIX CORPORATION
Executed: 2021-04-16
Assignees
SEMITRONIX CORPORATION
15F-F1, BUILDING A, NO. 3 XIDOUMEN ROAD, XIHU DISTRICT, HANGZHOU, ZHEJIANG, 310012, CHINA
ZHEJIANG UNIVERSITY
866 YUHANGTANG RD, HANGZHOU, ZHEJIANG, 310058, CHINA
Covered Property (1)
Addressable test circuit and test method for key parameters of transistors
Patent: 9,817,058 →
Application: 15/351,421 →
Publication: US 2017/0059645
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 14, 2016
From: PAN, WEIWEI; ZHENG, YONGJUN
To: SEMITRONIX CORPORATION
Reel/Frame 040314/0071 →