Patent Assignment
Reel/Frame 040705/0333
Assignment of Assignor's Interest
Recorded: 2016-12-12
Pages: 5
Assignors
OKADA, AKIRA
Executed: 2016-10-13
NOGUCHI, TAKAYA
Executed: 2016-10-11
TAKESAKO, NORIHIRO
Executed: 2016-10-07
Assignee
MITSUBISHI ELECTRIC CORPORATION
7-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, 100-8310, JAPAN
Covered Property
(1)
Device and Method for Inspecting Position of Probe, and Semiconductor Evaluation Apparatus
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.