IP Library Assignment 040788/0162
Patent Assignment
Reel/Frame 040788/0162

Assignment of Assignor's Interest

Recorded: 2016-12-28 Pages: 2
Assignors
YAGUCHI, TOSHIE
Executed: 2016-11-16
KOBAYASHI, HIROYUKI
Executed: 2016-11-28
YOTSUJI, TAKAFUMI
Executed: 2016-11-16
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Electron Microscope and Sample Observation Method
Patent: 9,754,762 →
Application: 15/322,659 →
Publication: US 2017/0133195
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →