IP Library Assignment 040817/0544
Patent Assignment
Reel/Frame 040817/0544

Assignment of Assignor's Interest

Recorded: 2017-01-02 Pages: 16
Assignors
TSAI, YUNG-TENG
Executed: 2016-12-29
LIN, HUNG-CHIN
Executed: 2016-12-29
SUN, CHIA-CHEN
Executed: 2016-12-29
WU, CHIH-YU
Executed: 2016-12-29
CHEN, JUN-MING
Executed: 2016-12-29
HUNG, CHUNG-CHIH
Executed: 2016-12-29
CHEN, SHENG-CHIEH
Executed: 2016-12-29
Assignee
UNITED MICROELECTRONICS CORP.
NO.3, LI-HSIN ROAD 2, SCIENCE-BASED INDUSTRIAL PARK, HSIN-CHU CITY, TAIWAN
Covered Property (1)
Semiconductor Structure and Method for Reviewing Defects
Application: 15/396,805 →
Publication: US 2018/0188185
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 26, 2021
From: UNITED MICROELECTRONICS CORPORATION
To: MARLIN SEMICONDUCTOR LIMITED
Reel/Frame 056991/0292 →