IP Library Assignment 041068/0567
Patent Assignment
Reel/Frame 041068/0567

Assignment of Assignor's Interest

Recorded: 2017-01-24 Pages: 3
Assignors
KANG, CHI-HUN
Executed: 2017-01-24
HAN, KEE-YUN
Executed: 2017-01-24
Assignee
LG SILTRON INC.
53 IMSU-RO, GUMI-SI, GYEONGSANGBUK-DO, 730-724, KOREA, REPUBLIC OF
Covered Property (1)
Defect Measuring Device for Wafers
Application: 15/328,852 →
Publication: US 2017/0213333
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jan 30, 2019
From: LG SILTRON INCORPORATED
To: SK SILTRON CO., LTD.
Reel/Frame 048189/0112 →