Patent Assignment
Reel/Frame 048189/0112
Change of Name
Recorded: 2019-01-30
Pages: 6
Assignor
LG SILTRON INCORPORATED
Executed: 2017-08-17
Assignee
SK SILTRON CO., LTD.
53 (IMSU-DONG) IMSU-RO, GUMI-SI GYEONGSANGBUK-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Defect Measuring Device for Wafers
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.