Patent Assignment
Reel/Frame 041206/0699
Assignment of Assignor's Interest
Recorded: 2017-02-08
Pages: 4
Assignors
KIM, MINHYUK
Executed: 2017-02-03
NAM, GILJOO
Executed: 2017-02-03
LEE, JOO HO
Executed: 2017-02-03
Assignee
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
291 DAEHAK-RO, YUSEONG-GU, DAEJEON, 34141, KOREA, REPUBLIC OF
Covered Property
(1)
Method and System for Simultaneously Measuring Surface Normal Vector and Surface Reflectance Function in Microscale