IP Library Granted Patent US 10,281,396
Granted Patent B2
US 10,281,396 · App. 15/427,821 · Granted May 7, 2019

Method and system for simultaneously measuring surface normal vector and surface reflectance function in microscale

Inventors: MinHyuk Kim (Daejeon, KR); Giljoo Nam (Daejeon, KR); Joo Ho Lee (Daejeon, KR)
Assignee: Korea Advanced Institute of Science and Technology
G01N21/55G01B11/24G02B21/06G02B21/26
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Quick Facts
Patent No.
US 10,281,396
App. No.
15/427,821
Granted
May 7, 2019
Kind
B2
Abstract

Disclosed is a system for simultaneously measuring a surface normal vector and a surface reflection function in microscale. The system includes a light dome having a hemispherical-shaped structure and including LEDs to radiate light to an object placed therein; a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; an xyz micro-translation stage arranged under the light dome and configured to move in xyz-directions to adjust a focal distance between the macro lens installed camera and the object, and a measurement unit configured to control the light dome and the macro lens installed camera to obtain a microscale image, and configured to simultaneously measure a surface normal vector and a surface reflection function of the object based on the microscale image.

Claims (30)

1. A method of simultaneously measuring a surface normal vector and a surface reflection function in microscale, wherein the method is performed through a system for simultaneously measuring the surface normal vector and the surface reflection function in microscale,

wherein the system comprises:

a light dome having a hemispherical-shaped structure and including a plurality of LEDs at a preset interval to radiate light to an object placed therein; and

a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; and

wherein the method comprises:

obtaining a microscale image by controlling the light dome and the macro lens installed camera, wherein the microscale image is obtained by photographing the object under the environment in which the light is radiated from the light dome, and wherein the obtaining of the microscale image comprises obtaining the microscale image by photographing the object under spherical harmonics (SH) illumination of the light dome and pointwise illumination which uses at least one of the LEDs of the light dome as a point light; and

simultaneously measuring a surface normal vector and a surface reflection function of the object based on the microscale image, wherein the measuring of the surface normal vector and the surface reflection function comprises calculating the surface normal vector of the object by using a shape-from-specular scheme based on the microscale image, and wherein the measuring of the surface normal vector and the surface reflection function further comprises calculating the surface reflection function of the object, based on the calculated surface normal vector, a normal distribution function term of reflectance of the object expressed as a non-parametric function, a geometric structure term representing shadowing/masking effects of the light emitted from the light dome in a view direction of the macro lens installed camera, and a Fresnel term concerned with a color vector.

2. A method of simultaneously measuring a surface normal vector and a surface reflection function in microscale, wherein the method is performed through a system for simultaneously measuring the surface normal vector and the surface reflection function in microscale,

wherein the system comprises:

a light dome having a hemispherical-shaped structure and including a plurality of LEDs at a preset interval to radiate light to an object placed therein;

a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; and

an xyz micro-translation stage arranged under the light dome and configured to move in xyz-directions to adjust a focal distance between the macro lens installed camera and the object, wherein the object is placed on the xyz micro-translation stage, and

wherein the method comprises:

obtaining a microscale image by controlling the light dome and the macro lens installed camera, wherein the microscale image is obtained by photographing the object under the environment in which the light is radiated from the light dome, and wherein the obtaining of the microscale image comprises obtaining the microscale image by photographing the object under spherical harmonics (SH) illumination of the light dome and pointwise illumination which uses at least one of the LEDs of the light dome as a point light; and

simultaneously measuring a surface normal vector and a surface reflection function of the object based on the microscale image, wherein the measuring of the surface normal vector and the surface reflection function comprises calculating the surface normal vector of the object by using a shape-from-specular scheme based on the microscale image, and wherein the measuring of the surface normal vector and the surface reflection function further comprises calculating the surface reflection function of the object, based on the calculated surface normal vector, a normal distribution function term of reflectance of the object expressed as a non-parametric function, a geometric structure term representing shadowing/masking effects of the light emitted from the light dome in a view direction of the macro lens installed camera, and a Fresnel term concerned with a color vector.

3. A computer program stored in a non-transitory computer readable medium which is coupled to a computer for implementing a system for simultaneously measuring a surface normal vector and a surface reflection function in microscale to execute a method of simultaneously measuring the surface normal vector and the surface reflection function in microscale,

wherein the system comprises:

a light dome having a hemispherical-shaped structure and including a plurality of LEDs at a preset interval to radiate light to an object placed therein; and

a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; and

wherein the method comprises:

obtaining a microscale image by controlling the light dome and the macro lens installed camera, wherein the microscale image is obtained by photographing the object under the environment in which the light is radiated from the light dome, and wherein the obtaining of the microscale image comprises obtaining the microscale image by photographing the object under spherical harmonics (SH) illumination of the light dome and pointwise illumination which uses at least one of the LEDs of the light dome as a point light; and

simultaneously measuring a surface normal vector and a surface reflection function of the object based on the microscale image, wherein the measuring of the surface normal vector and the surface reflection function comprises calculating the surface normal vector of the object by using a shape-from-specular scheme based on the microscale image, and wherein the measuring of the surface normal vector and the surface reflection function further comprises calculating the surface reflection function of the object, based on the calculated surface normal vector, a normal distribution function term of reflectance of the object expressed as a non-parametric function, a geometric structure term representing shadowing/masking effects of the light emitted from the light dome in a view direction of the macro lens installed camera, and a Fresnel term concerned with a color vector.

4. A computer program stored in a non-transitory computer readable medium which is coupled to a computer for implementing a system for simultaneously measuring a surface normal vector and a surface reflection function in microscale to execute a method of simultaneously measuring the surface normal vector and the surface reflection function in microscale,

wherein the system comprises:

a light dome having a hemispherical-shaped structure and including a plurality of LEDs at a preset interval to radiate light to an object placed therein;

a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; and

an xyz micro-translation stage arranged under the light dome and configured to move in xyz-directions to adjust a focal distance between the macro lens installed camera and the object, wherein the object is placed on the xyz micro-translation stage, and

wherein the method comprises:

obtaining a microscale image by controlling the light dome and the macro lens installed camera, wherein the microscale image is obtained by photographing the object under the environment in which the light is radiated from the light dome, and wherein the obtaining of the microscale image comprises obtaining the microscale image by photographing the object under spherical harmonics (SH) illumination of the light dome and pointwise illumination which uses at least one of the LEDs of the light dome as a point light; and

simultaneously measuring a surface normal vector and a surface reflection function of the object based on the microscale image, wherein the measuring of the surface normal vector and the surface reflection function comprises calculating the surface normal vector of the object by using a shape-from-specular scheme based on the microscale image, and wherein the measuring of the surface normal vector and the surface reflection function further comprises calculating the surface reflection function of the object, based on the calculated surface normal vector, a normal distribution function term of reflectance of the object expressed as a non-parametric function, a geometric structure term representing shadowing/masking effects of the light emitted from the light dome in a view direction of the macro lens installed camera, and a Fresnel term concerned with a color vector.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 8, 2017
From: KIM, MINHYUK; NAM, GILJOO; LEE, JOO HO
To: KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
Reel/Frame 041206/0699 →
Priority Claims (1)
KR 10-2016-0121871 · Sep 23, 2016 · national
Continuity (1)
Related Publication 20180087894A1 · Mar 29, 2018
Cited By (1)
US 12,361,639