IP Library › Assignment 041681/0717
Patent Assignment
Reel/Frame 041681/0717

Assignment of Assignor's Interest

Recorded: 2017-03-22 Pages: 5
Assignors
NAGATA, ATSUSHI
Executed: 2017-01-16
NAKAYAMA, SATOSHI
Executed: 2017-01-16
TANAKA, KEIICHI
Executed: 2017-01-16
CHINONE, KAZUO
Executed: 2017-01-16
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Radiation Analyzing Apparatus and Radiation Analyzing Method
Application: 15/465,910 →
Publication: US 2017/0276621
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0555 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →