IP Library › Assignment 041700/0012
Patent Assignment
Reel/Frame 041700/0012

Assignment of Assignor's Interest

Recorded: 2017-03-23 Pages: 4
Assignors
IWAHORI, TOSHIYUKI
Executed: 2017-01-16
OONISHI, TSUYOSHI
Executed: 2017-01-16
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Sample Holder and Focused Ion Beam Apparatus
Patent: 9,947,506 →
Application: 15/467,126 →
Publication: US 2017/0278667
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0555 →
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072903/0648 →