IP Library › Assignment 041749/0923
Patent Assignment
Reel/Frame 041749/0923

Assignment of Assignor's Interest

Recorded: 2017-03-27 Pages: 2
Assignors
SUNAOSHI, TAKESHI
Executed: 2017-01-27
NAGAKUBO, YASUHIRA
Executed: 2017-01-27
NIMURA, KAZUTAKA
Executed: 2017-01-27
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Charged Particle Beam Device, Electron Microscope and Sample Observation Method
Application: 15/514,539 →
Publication: US 2017/0221676
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →