Patent Assignment
Reel/Frame 041998/0034
Assignment of Assignor's Interest
Recorded: 2017-04-13
Pages: 4
Assignor
KOHNO, YUJI
Executed: 2017-02-10
Assignee
JEOL LTD.
1-2, MUSASHINO 3-CHOME, AKISHIMA, TOKYO, 196-8558, JAPAN
Covered Property
(1)
Electron Microscope and Method of Aberration Measurement