IP Library › Assignment 042523/0370
Patent Assignment
Reel/Frame 042523/0370

Assignment of Assignor's Interest

Recorded: 2017-05-30 Pages: 2
Assignors
HATANO, HISASHI
Executed: 2017-04-06
NAGOYA, KOICHI
Executed: 2017-04-06
KOBAYASHI, MAMORU
Executed: 2017-04-06
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Inspection Device, Display Device, and Defect Classification Device
Patent: 9,964,500 →
Application: 15/531,066 →
Publication: US 2017/0328846
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →