IP Library Assignment 042702/0772
Patent Assignment
Reel/Frame 042702/0772

Assignment of Assignor's Interest

Recorded: 2017-06-14 Pages: 3
Assignor
MISHIMA, KENICHI
Executed: 2017-05-26
Assignee
NIPPON MEKTRON, LTD.
12-15, SHIBA DAIMON 1-CHOME, MINATO-KU, TOKYO, 105-8585, JAPAN
Covered Property (1)
Substrate Inspection Device and Substrate Manufacturing Method
Application: 15/535,775 →
Publication: US 2018/0202946
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 30, 2024
From: NIPPON MEKTRON, LTD.
To: MEKTEC CORPORATION
Reel/Frame 069464/0771 →