Patent Assignment
Reel/Frame 042773/0173
Assignment of Assignor's Interest
Recorded: 2017-06-21
Pages: 8
Assignors
SUGITA, SHINJI
Executed: 2017-05-23
UMEMOTO, YUJI
Executed: 2017-06-16
ONISHI, TAKAKO
Executed: 2017-05-23
Assignee
OMRON CORPORATION
801, MINAMIFUDODO-CHO, HORIKAWAHIGASHIIRU, SHIOKOJI-DORI, SHIMOGYO-KU, KYOTO-SHI, KYOTO, 600-8530, JAPAN
Covered Property
(1)
X-Ray Inspection Apparatus and X-Ray Inspection Method