IP Library › Granted Patent US 10,605,748
Granted Patent B2
US 10,605,748 · App. 15/603,573 · Granted Mar 31, 2020

X-ray inspection apparatus and X-ray inspection method

Inventors: Shinji Sugita (Kyoto, JP); Yuji Umemoto (Osaka, JP); Takako Onishi (Kyotanabe, JP)
Assignee: OMRON Corporation
G01N23/04G01N23/046G01N2223/3303
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Quick Facts
Patent No.
US 10,605,748
App. No.
15/603,573
Granted
Mar 31, 2020
Kind
B2
Abstract

An X-ray inspection apparatus includes a stage that moves an inspection object, an X-ray source, and/or an X-ray camera by driving a motor, a position detection unit that periodically obtains a position detection value of the motor, and stores the value in association with time, an imaging timing obtaining unit that stores an imaging timing at which imaging is performed by the X-ray camera in association with time, an imaging position calculation unit that calculates relative positions of the inspection object, and the X-ray source and the X-ray camera corresponding to the imaging timing using the position detection value of the motor at the imaging timing, and a reconstruction unit that performs reconstruction using image data captured by the X-ray camera and the relative positions in the image data at the imaging timing.

Claims (25)

1. An X-ray inspection apparatus for capturing multiple sets of image data for an inspection object while a position of the inspection object is being changed relative to an X-ray source and an X-ray camera, and reconstructing three-dimensional data for the inspection object using the image data, the apparatus comprising:

a stage configured to move the X-ray source and the X-ray camera by driving a motor; and

a processor configured with a program to perform operations comprising:

operation as a position detection unit configured to periodically obtain a position of the X-ray source and store the position of the X-ray source in association with time, and obtain a position of the X-ray camera and store the position of the X-ray camera in association with time;

operation as an imaging timing obtaining unit configured to store, in association with time, an imaging timing at which imaging is performed by the X-ray camera;

operation as an imaging position calculation unit configured to:

calculate relative positions of the inspection object, the X-ray source, and the X-ray camera corresponding to the imaging timing using the stored position of the X-ray source and the stored position of the X-ray camera obtained at the imaging timing;

determine the relative positions using design information and the stored position of the X-ray source and the stored position of the X-ray camera obtained by the position detection unit; and

correct the relative positions using preliminary obtained calibration information; and

operation as a reconstruction unit configured to perform a reconstruction process using image data captured by the X-ray camera and the relative positions in the image data at the imaging timing.

2. The X-ray inspection apparatus according to claim 1 , wherein

the inspection object is fixed.

3. An X-ray inspection method used in an X-ray inspection apparatus for capturing multiple sets of image data for an inspection object while a position of the inspection object is being changed relative to an X-ray source and an X-ray camera, and reconstructing three-dimensional data for the inspection object using the image data, the method comprising:

periodically obtaining a position of the X-ray source and a position of the X-ray camera;

storing the position of the X-ray source in association with time and the position of the X-ray camera in association with time;

capturing multiple images of the inspection object with the X-ray camera while a position of the inspection object is being changed relative to the X-ray source and the X-ray camera;

storing an imaging timing at which imaging is performed by the X-ray camera;

calculating relative positions of the inspection object, the X-ray source, and the X-ray camera corresponding to the imaging timing using the stored position of the X-ray source and the stored position of the X-ray camera obtained at the imaging timing;

determining the relative positions using design information and the stored position of the X-ray source and the stored position of the X-ray camera;

correcting the relative positions using preliminary obtained calibration information; and

performing a reconstruction process using image data captured by the X-ray camera and the relative positions in the image data at the imaging timing.

4. A non-transitory computer-readable storage medium storing a program for enabling a computer to implement the steps included in the method according to claim 3 .

5. The method according to claim 3 , wherein calculating the relative positions of the inspection object, the X-ray source, and the X-ray camera corresponding to the imaging timing comprises calculating the relative positions of the inspection object, the X-ray source, and the X-ray camera corresponding to the imaging timing based on design information, the stored position of the X-ray source, and the stored position of the X-ray camera.

6. The method according to claim 5 , further comprising correcting the relative positions using preliminary obtained calibration information.

7. The method according to claim 3 , wherein the inspection object is fixed.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 21, 2017
From: SUGITA, SHINJI; UMEMOTO, YUJI; ONISHI, TAKAKO
To: OMRON CORPORATION
Reel/Frame 042773/0173 →
Priority Claims (1)
JP 2016-117187 · Jun 13, 2016 · national
Continuity (1)
Related Publication 20170356859A1 · Dec 14, 2017