Patent Assignment
Reel/Frame 042792/0582
Assignment of Assignor's Interest
Recorded: 2017-06-23
Pages: 10
Assignors
CHEN, CHIEN-HAO
Executed: 2017-06-19
HUANG, CHIEN-WEI
Executed: 2017-06-19
WANG, CHIA-HUNG
Executed: 2017-06-19
LEE, SHO-SHEN
Executed: 2017-06-19
Assignees
UNITED MICROELECTRONICS CORP.
NO.3, LI-HSIN ROAD 2, SCIENCE-BASED INDUSTRIAL PARK, HSIN-CHU CITY, TAIWAN
FUJIAN JINHUA INTEGRATED CIRCUIT CO., LTD.
6TH FLOOR, PODIUM OF ELECTRIC POWER COMPANY BUILDING, MEILING STREET, JINJIANG CITY, QUANZHOU CITY, FUJIAN PROVINCE, CHINA
Covered Property
(1)
Semiconductor Pattern for Monitoring Overlay and Critical Dimension at Post-Etching Stage and Metrology Method of the Same
Patent:
10,079,185 →
Application:
15/630,966 →
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.