Patent Assignment
Reel/Frame 052137/0656
Change of Address
Recorded: 2020-03-11
Pages: 7
Assignor
FUJIAN JINHUA INTEGRATED CIRCUIT CO., LTD.
Executed: 2017-09-19
Assignee
FUJIAN JINHUA INTEGRATED CIRCUIT CO., LTD.
NO.88, LIANHUA AVENUE, INTEGRATED CIRCUIT SCIENCE PARK, JINJIANG CITY, QUANZHOU CITY, FUJIAN PROVINCE, CHINA
Covered Properties
(2)
Semiconductor Structure for Preventing Row Hammering Issue in Dram Cell and Method for Manufacturing the Same
Patent:
10,043,811 →
Application:
15/627,455 →
Semiconductor Pattern for Monitoring Overlay and Critical Dimension at Post-Etching Stage and Metrology Method of the Same
Patent:
10,079,185 →
Application:
15/630,966 →
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 20, 2017
From: TSAI, CHIH-CHIEH; CHEN, PIN-HONG; CHEN, TZU-CHIEH; CHENG, TSUN-MIN
To: UNITED MICROELECTRONICS CORP.; FUJIAN JINHUA INTEGRATED CIRCUIT CO., LTD.
Reel/Frame 042752/0457 →
Assignment of Assignor's Interest
Jun 23, 2017
From: CHEN, CHIEN-HAO; HUANG, CHIEN-WEI; WANG, CHIA-HUNG; LEE, SHO-SHEN
To: UNITED MICROELECTRONICS CORP.; FUJIAN JINHUA INTEGRATED CIRCUIT CO., LTD.
Reel/Frame 042792/0582 →