Patent Assignment
Reel/Frame 042940/0399
Assignment of Assignor's Interest
Recorded: 2017-07-08
Pages: 5
Assignor
KABUSHIKI KAISHA TOSHIBA
Executed: 2017-06-30
Assignee
TOSHIBA MEMORY CORPORATION
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Properties
(7)
Semiconductor Memory Device
Planarization Method and Planarization Apparatus
Semiconductor Memory Device
Fault Detection Apparatus
Application:
14/473,615 →
Publication:
US 2014/0372068
Semiconductor Memory Device
Planarization Method and Planarization Apparatus
Probe Card Having Opposite Surfaces with Different Directions and Test Apparatus Including Probe Card Thereof
Related Assignments
(7)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 10, 2010
From: KANNO, SHINICHI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 025469/0885 →
Assignment of Assignor's Interest
Oct 11, 2013
From: GAWASE, AKIFUMI; MATSUI, YUKITERU; MINAMIHABA, GAKU; EDA, HAJIME
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 031388/0809 →
Assignment of Assignor's Interest
Jan 13, 2015
From: SETO, MOTOSHI; MURAKAMI, HIROAKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 034691/0676 →
Assignment of Assignor's Interest
Mar 4, 2016
From: FUJIWARA, TOMOKO; SUEYAMA, TAKAO; KANEDA, KEIKO; EGO, MICHIKO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037890/0907 →
Merger
Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
Change of Name and Address
Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
Change of Name and Address
Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →