IP Library Assignment 043060/0026
Patent Assignment
Reel/Frame 043060/0026

Assignment of Assignor's Interest

Recorded: 2017-07-21 Pages: 2
Assignors
SAKAI, KEI
Executed: 2017-06-12
YAMAGUCHI, SATORU
Executed: 2017-06-12
HIRAO, KAZUYUKI
Executed: 2017-06-12
TAKASUGI, YASUNORI
Executed: 2017-06-12
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Measurement Apparatus and Defect Inspection Apparatus
Application: 15/545,067 →
Publication: US 2018/0012349
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →