Patent Assignment
Reel/Frame 043984/0903
Assignment of Assignor's Interest
Recorded: 2017-10-30
Pages: 3
Assignor
BRAUER, BJORN
Executed: 2017-10-12
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Properties
(2)
Wafer Noise Reduction by Image Subtraction Across Layers
Inter-Layer Defect Inspection - Wafer Noise Reduction by Image Subtraction Across Layers
Application:
62/425,602 →